package com.ruoyi.system.mapper;
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import java.util.List;
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import java.util.Date;
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import org.apache.ibatis.annotations.Param;
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import com.ruoyi.system.domain.TTest;
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import com.ruoyi.system.domain.TTestBattery;
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import com.ruoyi.system.domain.TTestBatteryField;
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import com.ruoyi.system.domain.TTestChannelBinding;
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import com.ruoyi.system.domain.TTestCollectorChannel;
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import com.ruoyi.system.domain.TTestPlanStep;
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import com.ruoyi.system.domain.TTestResult;
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import com.ruoyi.system.domain.TTestWarningThreshold;
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import com.ruoyi.system.domain.TTestCollectorSource;
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import com.ruoyi.system.domain.TTestCollectorExceptionInterval;
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import com.ruoyi.system.domain.TTestReceptionInterval;
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import com.ruoyi.system.domain.TTestLogicStepMapping;
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import com.ruoyi.system.domain.TTestBackfillCursor;
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import com.ruoyi.system.domain.TTestIntegrityIssue;
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import com.ruoyi.system.domain.TDetectionChannel;
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import com.ruoyi.system.domain.TTestDataRevisionAction;
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import com.ruoyi.system.domain.TTestConsoleImportRecord;
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import com.ruoyi.system.domain.TTestDataOverride;
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import com.ruoyi.system.domain.vo.TestBatteryOptionVo;
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import com.ruoyi.system.domain.vo.TestChannelOptionVo;
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import com.ruoyi.system.domain.vo.TestCollectorOptionVo;
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import com.ruoyi.system.domain.vo.TestTypeOptionVo;
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import com.ruoyi.system.domain.vo.TestUserOptionVo;
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/** 测试配置及其只追加审计的数据访问接口。 */
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public interface TTestMapper
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{
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TTest selectTestById(Long testId);
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TTest selectTestByIdForUpdate(Long testId);
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List<TTest> selectTestList(TTest test);
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List<TTestBattery> selectBatteryNosByTestIds(@Param("testIds") List<Long> testIds);
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TTest selectTestByName(String testName);
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int insertTest(TTest test);
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int updateTest(TTest test);
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int deleteTestById(@Param("testId") Long testId, @Param("updateBy") String updateBy);
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int deleteTestBindingsByTestId(Long testId);
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int deleteTestCollectorChannelsByTestId(Long testId);
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int deleteTestPlanStepsByTestId(Long testId);
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int deleteTestBatteriesByTestId(Long testId);
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int deleteTestFieldsByTestId(Long testId);
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int deleteTestThresholdsByTestId(Long testId);
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int insertTestPlanStep(TTestPlanStep step);
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int insertTestBattery(TTestBattery battery);
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int insertTestBatteryField(TTestBatteryField field);
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int insertTestChannelBinding(TTestChannelBinding binding);
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int insertTestCollectorChannel(TTestCollectorChannel mapping);
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int insertTestThreshold(TTestWarningThreshold threshold);
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List<TTestPlanStep> selectTestPlanSteps(Long testId);
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List<TTestBattery> selectTestBatteries(Long testId);
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List<TTestBatteryField> selectTestBatteryFields(Long testId);
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List<TTestChannelBinding> selectTestChannelBindings(Long testId);
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List<TTestCollectorChannel> selectTestCollectorChannels(Long testId);
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List<TTestWarningThreshold> selectTestThresholds(Long testId);
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/** 按来源和起始边界顺序返回测试接收区间。 */
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List<TTestReceptionInterval> selectTestReceptionIntervals(Long testId);
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List<TTestResult> selectTestResults(TTestResult result);
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String selectLogicStepMappingsJson(Long testId);
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int updateLogicStepMappings(@Param("testId") Long testId, @Param("mappingsJson") String mappingsJson,
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@Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);
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int countTestTypeEnabled(Long testTypeId);
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int countUserEnabled(Long userId);
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int countBatteryInEnabledGroup(@Param("groupId") Long groupId, @Param("batteryNo") String batteryNo);
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int countRegisteredChannel(Long channelId);
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int countCollectorEnabled(Long collectorId);
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Integer selectCollectorChannelCount(Long collectorId);
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String selectCollectorCode(Long collectorId);
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List<TestUserOptionVo> selectEnabledUserOptions();
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List<TestTypeOptionVo> selectEnabledTestTypeOptions();
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List<TestBatteryOptionVo> selectEnabledBatteryOptions();
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List<TestChannelOptionVo> selectRegisteredChannelOptions();
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List<TestCollectorOptionVo> selectEnabledCollectorOptions();
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int insertTestAudit(@Param("testId") Long testId, @Param("eventType") String eventType,
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@Param("actorId") Long actorId, @Param("actorName") String actorName,
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@Param("previousValue") String previousValue, @Param("newValue") String newValue);
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/** 锁定检测柜通道的最新可观测事实，供开始接收校验使用。 */
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TDetectionChannel selectReceptionChannelForUpdate(Long channelId);
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/** 锁定当前检测柜通道租约；返回空表示可接入。 */
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TTestChannelBinding selectChannelLeaseForUpdate(Long channelId);
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int insertChannelLease(@Param("channelId") Long channelId, @Param("testId") Long testId,
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@Param("bindingId") Long bindingId, @Param("acquiredBy") Long acquiredBy,
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@Param("acquiredAtUtc") Date acquiredAtUtc);
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int insertCollectorChannelLease(@Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
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@Param("testId") Long testId, @Param("bindingId") Long bindingId,
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@Param("acquiredBy") Long acquiredBy, @Param("acquiredAtUtc") Date acquiredAtUtc);
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/** 为每个绑定来源追加一个开放接收区间；区间关闭后仅保留历史事实。 */
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int insertReceptionInterval(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
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@Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
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@Param("sourceChannelCode") String sourceChannelCode, @Param("actionAtUtc") Date actionAtUtc,
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@Param("boundaryNote") String boundaryNote);
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/** 在停止动作事务内关闭该测试全部开放区间，返回实际关闭数量。 */
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int closeOpenReceptionIntervals(@Param("testId") Long testId, @Param("endBoundaryAtUtc") Date endBoundaryAtUtc,
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@Param("boundaryNote") String boundaryNote);
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int deleteChannelLeasesByTestId(Long testId);
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int deleteCollectorChannelLeasesByTestId(Long testId);
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int hasReceivingTestForAdapter(@Param("adapterCode") String adapterCode);
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int hasPausedOrEndedTestForAdapter(@Param("adapterCode") String adapterCode);
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List<TDetectionChannel> selectReceivingChannelsForAdapter(@Param("adapterCode") String adapterCode);
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boolean collectorOnline(Long collectorId);
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int updateReceptionStarted(@Param("testId") Long testId, @Param("startedAtUtc") Date startedAtUtc,
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@Param("runtimeAttach") boolean runtimeAttach, @Param("updateBy") String updateBy);
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int updateReceptionPaused(@Param("testId") Long testId, @Param("updateBy") String updateBy,
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@Param("updatedAtUtc") Date updatedAtUtc);
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int updateReceptionResumed(@Param("testId") Long testId, @Param("updateBy") String updateBy,
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@Param("updatedAtUtc") Date updatedAtUtc);
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int updateReceptionStopped(@Param("testId") Long testId, @Param("updateBy") String updateBy,
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@Param("endedAtUtc") Date endedAtUtc);
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/** 查询仍在接收中的采集器来源。 */
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List<TTestCollectorSource> selectReceivingCollectorSources();
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/** 查询来源当前开放的断线区间。 */
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TTestCollectorExceptionInterval selectOpenCollectorException(@Param("testId") Long testId,
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@Param("batteryRelationId") Long batteryRelationId, @Param("collectorId") Long collectorId,
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@Param("channelCode") String channelCode);
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int insertCollectorExceptionInterval(TTestCollectorExceptionInterval interval);
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int closeCollectorExceptionInterval(@Param("intervalId") Long intervalId,
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@Param("recoveredAtUtc") Date recoveredAtUtc, @Param("missingToUtc") Date missingToUtc);
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List<TTestCollectorExceptionInterval> selectCollectorExceptionIntervals(Long testId);
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/** 查询需要自然结束或继续补采的测试。 */
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List<TTest> selectTestsForNaturalEnd();
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List<TTest> selectTestsForBackfill();
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/** 按稳定来源身份锁定补采游标，避免应用重启重复推进。 */
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TTestBackfillCursor selectBackfillCursorForUpdate(@Param("testId") Long testId,
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@Param("bindingId") Long bindingId, @Param("sourceType") String sourceType,
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@Param("sourceId") Long sourceId, @Param("sourceChannelCode") String sourceChannelCode);
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int insertBackfillCursor(TTestBackfillCursor cursor);
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int updateBackfillCursor(TTestBackfillCursor cursor);
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int updateTestBackfillStarted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
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int updateTestBackfillWaiting(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc,
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@Param("error") String error);
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int updateTestBackfillCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
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int updateTestCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
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int updateTestNaturallyEnded(@Param("testId") Long testId, @Param("endedAtUtc") Date endedAtUtc);
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String selectSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
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@Param("sequenceId") Long sequenceId);
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int insertBtsSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
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@Param("channelId") Long channelId, @Param("intervalId") Long intervalId,
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@Param("btsTestId") String btsTestId, @Param("sequenceId") Long sequenceId,
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@Param("deviceTimeUtc") Date deviceTimeUtc, @Param("deviceTimeRaw") String deviceTimeRaw,
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@Param("receivedAtUtc") Date receivedAtUtc, @Param("cycleNo") Integer cycleNo,
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@Param("stepNo") Integer stepNo, @Param("stepType") String stepType,
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@Param("testTimeMs") Long testTimeMs, @Param("voltageV") java.math.BigDecimal voltageV,
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@Param("currentA") java.math.BigDecimal currentA, @Param("capacityAh") java.math.BigDecimal capacityAh,
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@Param("energyWh") java.math.BigDecimal energyWh, @Param("contentSha256") byte[] contentSha256);
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int insertBtsMeasurement(@Param("sampleId") Long sampleId, @Param("metricCode") String metricCode,
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@Param("metricValue") java.math.BigDecimal metricValue, @Param("unit") String unit,
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@Param("sourceType") String sourceType);
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Long selectBtsSampleId(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
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@Param("sequenceId") Long sequenceId);
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int insertCollectorSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
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@Param("intervalId") Long intervalId,
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@Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
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@Param("sequenceId") Long sequenceId, @Param("deviceTimeUtc") Date deviceTimeUtc,
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@Param("deviceTimeRaw") String deviceTimeRaw, @Param("receivedAtUtc") Date receivedAtUtc,
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@Param("metricCode") String metricCode, @Param("metricValue") java.math.BigDecimal metricValue,
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@Param("unit") String unit, @Param("contentSha256") byte[] contentSha256);
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Long selectCollectorSampleId(@Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
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@Param("sequenceId") Long sequenceId, @Param("metricCode") String metricCode);
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String selectCollectorSampleContentHash(@Param("collectorId") Long collectorId,
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@Param("channelCode") String channelCode, @Param("sequenceId") Long sequenceId,
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@Param("metricCode") String metricCode);
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int insertBackfillConflict(@Param("testId") Long testId, @Param("channelId") Long channelId,
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@Param("detail") String detail);
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List<TTestIntegrityIssue> selectIntegrityIssues(Long testId);
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List<TTestIntegrityIssue> selectTestExceptionFacts(Long testId);
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List<Long> selectBtsSequencesByInterval(Long intervalId);
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List<Long> selectCollectorSequencesByInterval(Long intervalId);
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TTestIntegrityIssue selectOpenIntegrityIssue(@Param("intervalId") Long intervalId,
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@Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
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@Param("sourceChannelCode") String sourceChannelCode, @Param("missingFrom") Long missingFrom,
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@Param("missingTo") Long missingTo);
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List<TTestIntegrityIssue> selectOpenIntegrityIssues(@Param("intervalId") Long intervalId,
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@Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
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@Param("sourceChannelCode") String sourceChannelCode);
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int insertIntegrityIssue(TTestIntegrityIssue issue);
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int touchIntegrityIssue(@Param("issueId") Long issueId, @Param("retryCount") Integer retryCount,
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@Param("detail") String detail, @Param("detectedAtUtc") Date detectedAtUtc);
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int rewindBackfillCursor(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
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@Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
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@Param("sourceChannelCode") String sourceChannelCode, @Param("nextPosition") Long nextPosition);
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int resolveIntegrityIssues(@Param("testId") Long testId, @Param("intervalId") Long intervalId,
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@Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
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@Param("sourceChannelCode") String sourceChannelCode, @Param("resolvedAtUtc") Date resolvedAtUtc);
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int resolveIntegrityIssue(@Param("issueId") Long issueId, @Param("resolvedAtUtc") Date resolvedAtUtc);
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int countOpenIntegrityIssues(Long testId);
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int countOpenExceptions(Long testId);
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int insertDataRevisionAction(TTestDataRevisionAction action);
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int upsertDataOverride(TTestDataOverride override);
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List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId,
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@Param("dataType") String dataType);
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int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
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int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);
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int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
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Long selectBtsSampleIdByChannelSequence(@Param("testId") Long testId,
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@Param("channelId") Long channelId, @Param("sequenceId") Long sequenceId);
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int insertConsoleImportRecord(TTestConsoleImportRecord record);
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int countTestBatteryNo(@Param("testId") Long testId, @Param("batteryNo") String batteryNo);
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}
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