yeg
2026-09-01 0fcd0642efdff8d4e0584fa991aaea2178bc932b
ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
@@ -1,16 +1,26 @@
package com.ruoyi.system.mapper;
import java.util.List;
import java.util.Date;
import org.apache.ibatis.annotations.Param;
import com.ruoyi.system.domain.TTest;
import com.ruoyi.system.domain.TTestBattery;
import com.ruoyi.system.domain.TTestBatteryField;
import com.ruoyi.system.domain.TTestChannelBinding;
import com.ruoyi.system.domain.TTestCollectorChannel;
import com.ruoyi.system.domain.TTestFieldSnapshot;
import com.ruoyi.system.domain.TTestPlanStep;
import com.ruoyi.system.domain.TTestResult;
import com.ruoyi.system.domain.TTestWarningThreshold;
import com.ruoyi.system.domain.TTestCollectorSource;
import com.ruoyi.system.domain.TTestCollectorExceptionInterval;
import com.ruoyi.system.domain.TTestReceptionInterval;
import com.ruoyi.system.domain.TTestLogicStepMapping;
import com.ruoyi.system.domain.TTestBackfillCursor;
import com.ruoyi.system.domain.TTestIntegrityIssue;
import com.ruoyi.system.domain.TDetectionChannel;
import com.ruoyi.system.domain.TTestDataRevisionAction;
import com.ruoyi.system.domain.TTestConsoleImportRecord;
import com.ruoyi.system.domain.TTestDataOverride;
import com.ruoyi.system.domain.vo.TestBatteryOptionVo;
import com.ruoyi.system.domain.vo.TestChannelOptionVo;
import com.ruoyi.system.domain.vo.TestCollectorOptionVo;
@@ -23,13 +33,13 @@
    TTest selectTestById(Long testId);
    TTest selectTestByIdForUpdate(Long testId);
    List<TTest> selectTestList(TTest test);
    List<TTestBattery> selectBatteryNosByTestIds(@Param("testIds") List<Long> testIds);
    TTest selectTestByName(String testName);
    int insertTest(TTest test);
    int updateTest(TTest test);
    int deleteTestById(@Param("testId") Long testId, @Param("updateBy") String updateBy);
    int deleteTestBindingsByTestId(Long testId);
    int deleteTestCollectorChannelsByTestId(Long testId);
    int deleteTestFieldSnapshotsByTestId(Long testId);
    int deleteTestPlanStepsByTestId(Long testId);
    int deleteTestBatteriesByTestId(Long testId);
    int deleteTestFieldsByTestId(Long testId);
@@ -39,22 +49,31 @@
    int insertTestBatteryField(TTestBatteryField field);
    int insertTestChannelBinding(TTestChannelBinding binding);
    int insertTestCollectorChannel(TTestCollectorChannel mapping);
    int insertTestFieldSnapshot(TTestFieldSnapshot snapshot);
    int insertTestThreshold(TTestWarningThreshold threshold);
    List<TTestPlanStep> selectTestPlanSteps(Long testId);
    List<TTestBattery> selectTestBatteries(Long testId);
    List<TTestBatteryField> selectTestBatteryFields(Long testId);
    List<TTestChannelBinding> selectTestChannelBindings(Long testId);
    List<TTestCollectorChannel> selectTestCollectorChannels(Long testId);
    List<TTestFieldSnapshot> selectTestFieldSnapshots(Long testId);
    List<TTestWarningThreshold> selectTestThresholds(Long testId);
    /** 按来源和起始边界顺序返回测试接收区间。 */
    List<TTestReceptionInterval> selectTestReceptionIntervals(Long testId);
    /** 查询当前正在接收的测试,供接收调度绑定测试事实。 */
    List<Long> selectReceivingTestIds();
    List<java.util.Map<String, Object>> selectPersistedRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);
    List<java.util.Map<String, Object>> selectPersistedSteps(@org.apache.ibatis.annotations.Param("testId") Long testId);
    List<java.util.Map<String, Object>> selectPersistedCycles(@org.apache.ibatis.annotations.Param("testId") Long testId);
    List<TTestResult> selectTestResults(TTestResult result);
    String selectLogicStepMappingsJson(Long testId);
    int updateLogicStepMappings(@Param("testId") Long testId, @Param("mappingsJson") String mappingsJson,
            @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);
    int countTestTypeEnabled(Long testTypeId);
    int countUserEnabled(Long userId);
    int countBatteryInEnabledGroup(@Param("groupId") Long groupId, @Param("batteryNo") String batteryNo);
    int countRegisteredChannel(Long channelId);
    int countCollectorEnabled(Long collectorId);
    Integer selectCollectorChannelCount(Long collectorId);
    String selectCollectorCode(Long collectorId);
    List<TestUserOptionVo> selectEnabledUserOptions();
    List<TestTypeOptionVo> selectEnabledTestTypeOptions();
    List<TestBatteryOptionVo> selectEnabledBatteryOptions();
@@ -63,4 +82,141 @@
    int insertTestAudit(@Param("testId") Long testId, @Param("eventType") String eventType,
            @Param("actorId") Long actorId, @Param("actorName") String actorName,
            @Param("previousValue") String previousValue, @Param("newValue") String newValue);
    /** 锁定检测柜通道的最新可观测事实,供开始接收校验使用。 */
    TDetectionChannel selectReceptionChannelForUpdate(Long channelId);
    /** 锁定当前检测柜通道租约;返回空表示可接入。 */
    TTestChannelBinding selectChannelLeaseForUpdate(Long channelId);
    int insertChannelLease(@Param("channelId") Long channelId, @Param("testId") Long testId,
            @Param("bindingId") Long bindingId, @Param("acquiredBy") Long acquiredBy,
            @Param("acquiredAtUtc") Date acquiredAtUtc);
    int insertCollectorChannelLease(@Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
            @Param("testId") Long testId, @Param("bindingId") Long bindingId,
            @Param("acquiredBy") Long acquiredBy, @Param("acquiredAtUtc") Date acquiredAtUtc);
    /** 为每个绑定来源追加一个开放接收区间;区间关闭后仅保留历史事实。 */
    int insertReceptionInterval(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
            @Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
            @Param("sourceChannelCode") String sourceChannelCode, @Param("actionAtUtc") Date actionAtUtc,
            @Param("boundaryNote") String boundaryNote);
    /** 在停止动作事务内关闭该测试全部开放区间,返回实际关闭数量。 */
    int closeOpenReceptionIntervals(@Param("testId") Long testId, @Param("endBoundaryAtUtc") Date endBoundaryAtUtc,
            @Param("boundaryNote") String boundaryNote);
    int deleteChannelLeasesByTestId(Long testId);
    int deleteCollectorChannelLeasesByTestId(Long testId);
    int hasReceivingTestForAdapter(@Param("adapterCode") String adapterCode);
    int hasPausedOrEndedTestForAdapter(@Param("adapterCode") String adapterCode);
    List<TDetectionChannel> selectReceivingChannelsForAdapter(@Param("adapterCode") String adapterCode);
    boolean collectorOnline(Long collectorId);
    int updateReceptionStarted(@Param("testId") Long testId, @Param("startedAtUtc") Date startedAtUtc,
            @Param("runtimeAttach") boolean runtimeAttach, @Param("updateBy") String updateBy);
    int updateReceptionPaused(@Param("testId") Long testId, @Param("updateBy") String updateBy,
            @Param("updatedAtUtc") Date updatedAtUtc);
    int updateReceptionResumed(@Param("testId") Long testId, @Param("updateBy") String updateBy,
            @Param("updatedAtUtc") Date updatedAtUtc);
    int updateReceptionStopped(@Param("testId") Long testId, @Param("updateBy") String updateBy,
            @Param("endedAtUtc") Date endedAtUtc);
    /** 查询仍在接收中的采集器来源。 */
    List<TTestCollectorSource> selectReceivingCollectorSources();
    /** 查询来源当前开放的断线区间。 */
    TTestCollectorExceptionInterval selectOpenCollectorException(@Param("testId") Long testId,
            @Param("batteryRelationId") Long batteryRelationId, @Param("collectorId") Long collectorId,
            @Param("channelCode") String channelCode);
    int insertCollectorExceptionInterval(TTestCollectorExceptionInterval interval);
    int closeCollectorExceptionInterval(@Param("intervalId") Long intervalId,
            @Param("recoveredAtUtc") Date recoveredAtUtc, @Param("missingToUtc") Date missingToUtc);
    List<TTestCollectorExceptionInterval> selectCollectorExceptionIntervals(Long testId);
    /** 查询需要自然结束或继续补采的测试。 */
    List<TTest> selectTestsForNaturalEnd();
    List<TTest> selectTestsForBackfill();
    /** 按稳定来源身份锁定补采游标,避免应用重启重复推进。 */
    TTestBackfillCursor selectBackfillCursorForUpdate(@Param("testId") Long testId,
            @Param("bindingId") Long bindingId, @Param("sourceType") String sourceType,
            @Param("sourceId") Long sourceId, @Param("sourceChannelCode") String sourceChannelCode);
    int insertBackfillCursor(TTestBackfillCursor cursor);
    int updateBackfillCursor(TTestBackfillCursor cursor);
    int updateTestBackfillStarted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
    int updateTestBackfillWaiting(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc,
            @Param("error") String error);
    int updateTestBackfillCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
    int updateTestCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
    int updateTestNaturallyEnded(@Param("testId") Long testId, @Param("endedAtUtc") Date endedAtUtc);
    String selectSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
            @Param("sequenceId") Long sequenceId);
    /** 按测试事实查询通道序号,避免补采重复写入已即时接收的采样。 */
    String selectTestSampleContentHash(@Param("testId") Long testId, @Param("channelId") Long channelId,
            @Param("sequenceId") Long sequenceId);
    int insertBtsSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
            @Param("channelId") Long channelId, @Param("intervalId") Long intervalId,
            @Param("btsTestId") String btsTestId, @Param("sequenceId") Long sequenceId,
            @Param("deviceTimeUtc") Date deviceTimeUtc, @Param("deviceTimeRaw") String deviceTimeRaw,
            @Param("receivedAtUtc") Date receivedAtUtc, @Param("cycleNo") Integer cycleNo,
            @Param("stepNo") Integer stepNo, @Param("stepType") String stepType, @Param("stepName") String stepName,
            @Param("testTimeMs") Long testTimeMs, @Param("voltageV") java.math.BigDecimal voltageV,
            @Param("currentA") java.math.BigDecimal currentA, @Param("capacityAh") java.math.BigDecimal capacityAh,
            @Param("energyWh") java.math.BigDecimal energyWh, @Param("contentSha256") byte[] contentSha256);
    int insertBtsMeasurement(@Param("sampleId") Long sampleId, @Param("metricCode") String metricCode,
            @Param("metricValue") java.math.BigDecimal metricValue, @Param("unit") String unit,
            @Param("sourceType") String sourceType);
    Long selectBtsSampleId(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
            @Param("sequenceId") Long sequenceId);
    int insertCollectorSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
            @Param("intervalId") Long intervalId,
            @Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
            @Param("sequenceId") Long sequenceId, @Param("deviceTimeUtc") Date deviceTimeUtc,
            @Param("deviceTimeRaw") String deviceTimeRaw, @Param("receivedAtUtc") Date receivedAtUtc,
            @Param("metricCode") String metricCode, @Param("metricValue") java.math.BigDecimal metricValue,
            @Param("unit") String unit, @Param("contentSha256") byte[] contentSha256);
    Long selectCollectorSampleId(@Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
            @Param("sequenceId") Long sequenceId, @Param("metricCode") String metricCode);
    String selectCollectorSampleContentHash(@Param("collectorId") Long collectorId,
            @Param("channelCode") String channelCode, @Param("sequenceId") Long sequenceId,
            @Param("metricCode") String metricCode);
    int insertBackfillConflict(@Param("testId") Long testId, @Param("channelId") Long channelId,
            @Param("detail") String detail);
    List<TTestIntegrityIssue> selectIntegrityIssues(Long testId);
    List<TTestIntegrityIssue> selectTestExceptionFacts(Long testId);
    List<Long> selectBtsSequencesByInterval(Long intervalId);
    List<Long> selectCollectorSequencesByInterval(Long intervalId);
    TTestIntegrityIssue selectOpenIntegrityIssue(@Param("intervalId") Long intervalId,
            @Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
            @Param("sourceChannelCode") String sourceChannelCode, @Param("missingFrom") Long missingFrom,
            @Param("missingTo") Long missingTo);
    List<TTestIntegrityIssue> selectOpenIntegrityIssues(@Param("intervalId") Long intervalId,
            @Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
            @Param("sourceChannelCode") String sourceChannelCode);
    int insertIntegrityIssue(TTestIntegrityIssue issue);
    int touchIntegrityIssue(@Param("issueId") Long issueId, @Param("retryCount") Integer retryCount,
            @Param("detail") String detail, @Param("detectedAtUtc") Date detectedAtUtc);
    int rewindBackfillCursor(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
            @Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
            @Param("sourceChannelCode") String sourceChannelCode, @Param("nextPosition") Long nextPosition);
    int resolveIntegrityIssues(@Param("testId") Long testId, @Param("intervalId") Long intervalId,
            @Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
            @Param("sourceChannelCode") String sourceChannelCode, @Param("resolvedAtUtc") Date resolvedAtUtc);
    int resolveIntegrityIssue(@Param("issueId") Long issueId, @Param("resolvedAtUtc") Date resolvedAtUtc);
    int countOpenIntegrityIssues(Long testId);
    int countOpenExceptions(Long testId);
    int insertDataRevisionAction(TTestDataRevisionAction action);
    List<TTestDataRevisionAction> selectDataRevisionActions(TTestDataRevisionAction query);
    TTestDataRevisionAction selectDataRevisionActionById(Long actionId);
    int upsertDataOverride(TTestDataOverride override);
    List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId,
            @Param("dataType") String dataType);
    int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
    int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);
    int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
    Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId,
            @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
            @Param("sequenceId") Long sequenceId);
    List<Long> selectBtsSampleIdsByDeviceChannelStep(@Param("testId") Long testId,
            @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
            @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo);
    List<Long> selectBtsSampleIdsByDeviceChannelCycle(@Param("testId") Long testId,
            @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
            @Param("cycleNo") Integer cycleNo);
    int insertConsoleImportRecord(TTestConsoleImportRecord record);
    int countTestBatteryNo(@Param("testId") Long testId, @Param("batteryNo") String batteryNo);
}