| | |
| | | import com.ruoyi.system.domain.TTestCollectorSource; |
| | | import com.ruoyi.system.domain.TTestCollectorExceptionInterval; |
| | | import com.ruoyi.system.domain.TTestReceptionInterval; |
| | | import com.ruoyi.system.domain.TTestLogicStepMapping; |
| | | import com.ruoyi.system.domain.TTestBackfillCursor; |
| | | import com.ruoyi.system.domain.TTestIntegrityIssue; |
| | | import com.ruoyi.system.domain.TDetectionChannel; |
| | | import com.ruoyi.system.domain.TTestDataRevisionAction; |
| | | import com.ruoyi.system.domain.TTestConsoleImportRecord; |
| | | import com.ruoyi.system.domain.TTestDataOverride; |
| | | import com.ruoyi.system.domain.vo.TestBatteryOptionVo; |
| | | import com.ruoyi.system.domain.vo.TestChannelOptionVo; |
| | | import com.ruoyi.system.domain.vo.TestCollectorOptionVo; |
| | |
| | | List<TTestWarningThreshold> selectTestThresholds(Long testId); |
| | | /** 按来源和起始边界顺序返回测试接收区间。 */ |
| | | List<TTestReceptionInterval> selectTestReceptionIntervals(Long testId); |
| | | /** 查询当前正在接收的测试,供接收调度绑定测试事实。 */ |
| | | List<Long> selectReceivingTestIds(); |
| | | List<java.util.Map<String, Object>> selectPersistedRecords(@org.apache.ibatis.annotations.Param("testId") Long testId); |
| | | List<java.util.Map<String, Object>> selectPersistedSteps(@org.apache.ibatis.annotations.Param("testId") Long testId); |
| | | List<java.util.Map<String, Object>> selectPersistedCycles(@org.apache.ibatis.annotations.Param("testId") Long testId); |
| | | List<TTestResult> selectTestResults(TTestResult result); |
| | | String selectLogicStepMappingsJson(Long testId); |
| | | int updateLogicStepMappings(@Param("testId") Long testId, @Param("mappingsJson") String mappingsJson, |
| | | @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime); |
| | | int countTestTypeEnabled(Long testTypeId); |
| | | int countUserEnabled(Long userId); |
| | | int countBatteryInEnabledGroup(@Param("groupId") Long groupId, @Param("batteryNo") String batteryNo); |
| | |
| | | int updateTestNaturallyEnded(@Param("testId") Long testId, @Param("endedAtUtc") Date endedAtUtc); |
| | | String selectSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId, |
| | | @Param("sequenceId") Long sequenceId); |
| | | /** 按测试事实查询通道序号,避免补采重复写入已即时接收的采样。 */ |
| | | String selectTestSampleContentHash(@Param("testId") Long testId, @Param("channelId") Long channelId, |
| | | @Param("sequenceId") Long sequenceId); |
| | | int insertBtsSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId, |
| | | @Param("channelId") Long channelId, @Param("intervalId") Long intervalId, |
| | | @Param("btsTestId") String btsTestId, @Param("sequenceId") Long sequenceId, |
| | | @Param("deviceTimeUtc") Date deviceTimeUtc, @Param("deviceTimeRaw") String deviceTimeRaw, |
| | | @Param("receivedAtUtc") Date receivedAtUtc, @Param("cycleNo") Integer cycleNo, |
| | | @Param("stepNo") Integer stepNo, @Param("stepType") String stepType, |
| | | @Param("stepNo") Integer stepNo, @Param("stepType") String stepType, @Param("stepName") String stepName, |
| | | @Param("testTimeMs") Long testTimeMs, @Param("voltageV") java.math.BigDecimal voltageV, |
| | | @Param("currentA") java.math.BigDecimal currentA, @Param("capacityAh") java.math.BigDecimal capacityAh, |
| | | @Param("energyWh") java.math.BigDecimal energyWh, @Param("contentSha256") byte[] contentSha256); |
| | |
| | | int resolveIntegrityIssue(@Param("issueId") Long issueId, @Param("resolvedAtUtc") Date resolvedAtUtc); |
| | | int countOpenIntegrityIssues(Long testId); |
| | | int countOpenExceptions(Long testId); |
| | | |
| | | int insertDataRevisionAction(TTestDataRevisionAction action); |
| | | List<TTestDataRevisionAction> selectDataRevisionActions(TTestDataRevisionAction query); |
| | | TTestDataRevisionAction selectDataRevisionActionById(Long actionId); |
| | | int upsertDataOverride(TTestDataOverride override); |
| | | List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId, |
| | | @Param("dataType") String dataType); |
| | | int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds); |
| | | int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds); |
| | | int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds); |
| | | Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId, |
| | | @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo, |
| | | @Param("sequenceId") Long sequenceId); |
| | | List<Long> selectBtsSampleIdsByDeviceChannelStep(@Param("testId") Long testId, |
| | | @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo, |
| | | @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo); |
| | | List<Long> selectBtsSampleIdsByDeviceChannelCycle(@Param("testId") Long testId, |
| | | @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo, |
| | | @Param("cycleNo") Integer cycleNo); |
| | | int insertConsoleImportRecord(TTestConsoleImportRecord record); |
| | | int countTestBatteryNo(@Param("testId") Long testId, @Param("batteryNo") String batteryNo); |
| | | } |