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2026-09-05 dd1af98f7e679290e5280e2aff58d7ff5237c5fb 
 ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java


@@ -11,11 +11,15 @@


import com.ruoyi.system.domain.TTestPlanStep;


import com.ruoyi.system.domain.TTestResult;


import com.ruoyi.system.domain.TTestWarningThreshold;


import com.ruoyi.system.domain.TTestWarningException;


import com.ruoyi.system.domain.TTestLogicStepMapping;


import com.ruoyi.system.domain.TDetectionChannel;


import com.ruoyi.system.domain.TTestDataRevisionAction;


import com.ruoyi.system.domain.TTestConsoleImportRecord;


import com.ruoyi.system.domain.TTestDataOverride;


import com.ruoyi.system.domain.TTestRealtimeRecord;


import com.ruoyi.system.domain.TTestStepRecord;


import com.ruoyi.system.domain.TTestCycleRecord;


import com.ruoyi.system.domain.vo.TestBatteryOptionVo;


import com.ruoyi.system.domain.vo.TestChannelOptionVo;


import com.ruoyi.system.domain.vo.TestCollectorOptionVo;


@@ -33,6 +37,7 @@


    int insertTest(TTest test);


    int updateTest(TTest test);


    int deleteTestById(@Param("testId") Long testId, @Param("updateBy") String updateBy);


    int deleteTestThresholdRowsByTestId(Long testId);


    int deleteTestBindingsByTestId(Long testId);


    int deleteTestCollectorChannelsByTestId(Long testId);


    int deleteTestPlanStepsByTestId(Long testId);


@@ -48,9 +53,25 @@


    List<TTestPlanStep> selectTestPlanSteps(Long testId);


    List<TTestBattery> selectTestBatteries(Long testId);


    List<TTestBatteryField> selectTestBatteryFields(Long testId);


    /** 读取测试所选电池组的当前字段值，不创建测试快照。 */


    List<TTestBatteryField> selectCurrentBatteryFields(Long testId);


    List<TTestChannelBinding> selectTestChannelBindings(Long testId);


    List<TTestCollectorChannel> selectTestCollectorChannels(Long testId);


    List<TTestWarningThreshold> selectTestThresholds(Long testId);


    /** 以测试、指标和阈值规则为开放异常键原子聚合成功接收的超限值。 */


    int upsertWarningException(@Param("testId") Long testId, @Param("thresholdId") Long thresholdId,


            @Param("sourceType") String sourceType, @Param("sourceIdentity") String sourceIdentity,


            @Param("metricCode") String metricCode, @Param("value") java.math.BigDecimal value,


            @Param("unit") String unit, @Param("ruleSnapshot") String ruleSnapshot,


            @Param("severity") String severity, @Param("occurredAt") Date occurredAt);


    /** 查询异常事实；不从设备状态或缺失数据推导异常。 */


    List<TTestWarningException> selectWarningExceptions(@Param("testId") Long testId,


            @Param("status") String status);


    TTestWarningException selectWarningExceptionById(Long exceptionId);


    /** 仅将开放异常转为已关闭，原始异常事实仍保留。 */


    int closeWarningException(@Param("exceptionId") Long exceptionId, @Param("handledBy") Long handledBy,


            @Param("handledByName") String handledByName, @Param("handledAt") Date handledAt,


            @Param("handlingNote") String handlingNote);


    /** 查询当前正在接收的测试，供接收调度绑定测试事实。 */


    List<Long> selectReceivingTestIds();


    int insertRealtimeSnapshot(@Param("testId") Long testId, @Param("bindingId") Long bindingId,


@@ -66,6 +87,18 @@


            @Param("positivePotential") java.math.BigDecimal positivePotential,


            @Param("negativePotential") java.math.BigDecimal negativePotential,


            @Param("extensionMeasurementsJson") String extensionMeasurementsJson, @Param("contentSha256") byte[] contentSha256);


    int insertRealtimeRecord(TTestRealtimeRecord record);


    String selectRealtimeRecordContentHash(@Param("testId") Long testId, @Param("testBatteryId") Long testBatteryId,


            @Param("captureSlotUtc") Date captureSlotUtc);


    int insertStepRecord(TTestStepRecord record);


    int insertCycleRecord(TTestCycleRecord record);


    String selectStepRecordContentHash(@Param("testBatteryId") Long testBatteryId,


            @Param("sourceIdentity") String sourceIdentity, @Param("dedupeKey") String dedupeKey);


    String selectCycleRecordContentHash(@Param("testBatteryId") Long testBatteryId,


            @Param("sourceIdentity") String sourceIdentity, @Param("dedupeKey") String dedupeKey);


    List<java.util.Map<String, Object>> selectPersistedFinalRealtimeRecords(@Param("testId") Long testId);


    List<java.util.Map<String, Object>> selectPersistedFinalStepRecords(@Param("testId") Long testId);


    List<java.util.Map<String, Object>> selectPersistedFinalCycleRecords(@Param("testId") Long testId);


    List<java.util.Map<String, Object>> selectPersistedRealtimeSnapshots(@Param("testId") Long testId);


    List<java.util.Map<String, Object>> selectPersistedRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);


    List<java.util.Map<String, Object>> selectPersistedCollectorRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);


@@ -74,6 +107,8 @@


    List<TTestResult> selectTestResults(TTestResult result);


    String selectLogicStepMappingsJson(Long testId);


    int updateLogicStepMappings(@Param("testId") Long testId, @Param("mappingsJson") String mappingsJson,


            @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);


    int updateConsoleDetail(@Param("testId") Long testId, @Param("detailJson") String detailJson,


            @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);


    int countTestTypeEnabled(Long testTypeId);


    int countUserEnabled(Long userId);


@@ -141,6 +176,18 @@


    int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);


    int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);


    int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);


    int deleteRealtimeRecordsByIds(@Param("testId") Long testId, @Param("recordIds") List<Long> recordIds);


    int deleteRealtimeSnapshotsByIds(@Param("testId") Long testId, @Param("snapshotIds") List<Long> snapshotIds);


    int deleteStepRecordsByIds(@Param("testId") Long testId, @Param("recordIds") List<Long> recordIds);


    int deleteCycleRecordsByIds(@Param("testId") Long testId, @Param("recordIds") List<Long> recordIds);


    int deleteCollectorSamplesByIdentities(@Param("testId") Long testId, @Param("identities") List<String> identities);


    int deleteTestRealtimeRecordsByTestId(Long testId);


    int deleteTestRealtimeSnapshotsByTestId(Long testId);


    int deleteTestStepRecordsByTestId(Long testId);


    int deleteTestCycleRecordsByTestId(Long testId);


    int deleteTestDataRevisionActionsByTestId(Long testId);


    int deleteTestDataOverridesByTestId(Long testId);


    int deleteTestConsoleImportRecordsByTestId(Long testId);


    Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId,


            @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,


            @Param("sequenceId") Long sequenceId);