From 0fcd0642efdff8d4e0584fa991aaea2178bc932b Mon Sep 17 00:00:00 2001
From: yeg <1347747024@qq.com>
Date: 星期二, 01 九月 2026 22:48:35 +0800
Subject: [PATCH] 测试控制台持续更新
---
ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java | 38 +++++++++++++++++++++++++++++++++++++-
1 files changed, 37 insertions(+), 1 deletions(-)
diff --git a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
index b567608..25139a7 100644
--- a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
+++ b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
@@ -14,9 +14,13 @@
import com.ruoyi.system.domain.TTestCollectorSource;
import com.ruoyi.system.domain.TTestCollectorExceptionInterval;
import com.ruoyi.system.domain.TTestReceptionInterval;
+import com.ruoyi.system.domain.TTestLogicStepMapping;
import com.ruoyi.system.domain.TTestBackfillCursor;
import com.ruoyi.system.domain.TTestIntegrityIssue;
import com.ruoyi.system.domain.TDetectionChannel;
+import com.ruoyi.system.domain.TTestDataRevisionAction;
+import com.ruoyi.system.domain.TTestConsoleImportRecord;
+import com.ruoyi.system.domain.TTestDataOverride;
import com.ruoyi.system.domain.vo.TestBatteryOptionVo;
import com.ruoyi.system.domain.vo.TestChannelOptionVo;
import com.ruoyi.system.domain.vo.TestCollectorOptionVo;
@@ -54,7 +58,15 @@
List<TTestWarningThreshold> selectTestThresholds(Long testId);
/** 按来源和起始边界顺序返回测试接收区间。 */
List<TTestReceptionInterval> selectTestReceptionIntervals(Long testId);
+ /** 查询当前正在接收的测试，供接收调度绑定测试事实。 */
+ List<Long> selectReceivingTestIds();
+ List<java.util.Map<String, Object>> selectPersistedRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedSteps(@org.apache.ibatis.annotations.Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedCycles(@org.apache.ibatis.annotations.Param("testId") Long testId);
List<TTestResult> selectTestResults(TTestResult result);
+ String selectLogicStepMappingsJson(Long testId);
+ int updateLogicStepMappings(@Param("testId") Long testId, @Param("mappingsJson") String mappingsJson,
+ @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);
int countTestTypeEnabled(Long testTypeId);
int countUserEnabled(Long userId);
int countBatteryInEnabledGroup(@Param("groupId") Long groupId, @Param("batteryNo") String batteryNo);
@@ -132,12 +144,15 @@
int updateTestNaturallyEnded(@Param("testId") Long testId, @Param("endedAtUtc") Date endedAtUtc);
String selectSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
@Param("sequenceId") Long sequenceId);
+ /** 按测试事实查询通道序号，避免补采重复写入已即时接收的采样。 */
+ String selectTestSampleContentHash(@Param("testId") Long testId, @Param("channelId") Long channelId,
+ @Param("sequenceId") Long sequenceId);
int insertBtsSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
@Param("channelId") Long channelId, @Param("intervalId") Long intervalId,
@Param("btsTestId") String btsTestId, @Param("sequenceId") Long sequenceId,
@Param("deviceTimeUtc") Date deviceTimeUtc, @Param("deviceTimeRaw") String deviceTimeRaw,
@Param("receivedAtUtc") Date receivedAtUtc, @Param("cycleNo") Integer cycleNo,
- @Param("stepNo") Integer stepNo, @Param("stepType") String stepType,
+ @Param("stepNo") Integer stepNo, @Param("stepType") String stepType, @Param("stepName") String stepName,
@Param("testTimeMs") Long testTimeMs, @Param("voltageV") java.math.BigDecimal voltageV,
@Param("currentA") java.math.BigDecimal currentA, @Param("capacityAh") java.math.BigDecimal capacityAh,
@Param("energyWh") java.math.BigDecimal energyWh, @Param("contentSha256") byte[] contentSha256);
@@ -183,4 +198,25 @@
int resolveIntegrityIssue(@Param("issueId") Long issueId, @Param("resolvedAtUtc") Date resolvedAtUtc);
int countOpenIntegrityIssues(Long testId);
int countOpenExceptions(Long testId);
+
+ int insertDataRevisionAction(TTestDataRevisionAction action);
+ List<TTestDataRevisionAction> selectDataRevisionActions(TTestDataRevisionAction query);
+ TTestDataRevisionAction selectDataRevisionActionById(Long actionId);
+ int upsertDataOverride(TTestDataOverride override);
+ List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId,
+ @Param("dataType") String dataType);
+ int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
+ int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);
+ int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
+ Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("sequenceId") Long sequenceId);
+ List<Long> selectBtsSampleIdsByDeviceChannelStep(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo);
+ List<Long> selectBtsSampleIdsByDeviceChannelCycle(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("cycleNo") Integer cycleNo);
+ int insertConsoleImportRecord(TTestConsoleImportRecord record);
+ int countTestBatteryNo(@Param("testId") Long testId, @Param("batteryNo") String batteryNo);
}
--
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