From 74f55db1acd945f4860b2d0b4bae48e2b918b32b Mon Sep 17 00:00:00 2001
From: yeg <1347747024@qq.com>
Date: 星期三, 02 九月 2026 11:30:30 +0800
Subject: [PATCH] 移除接收区间补采与完整性旧链路
---
ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java | 130 ++++++++++++++++++++++---------------------
1 files changed, 66 insertions(+), 64 deletions(-)
diff --git a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
index 25139a7..f610df5 100644
--- a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
+++ b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
@@ -11,12 +11,12 @@
import com.ruoyi.system.domain.TTestPlanStep;
import com.ruoyi.system.domain.TTestResult;
import com.ruoyi.system.domain.TTestWarningThreshold;
-import com.ruoyi.system.domain.TTestCollectorSource;
import com.ruoyi.system.domain.TTestCollectorExceptionInterval;
-import com.ruoyi.system.domain.TTestReceptionInterval;
-import com.ruoyi.system.domain.TTestLogicStepMapping;
+import com.ruoyi.system.domain.TTestCollectorSource;
import com.ruoyi.system.domain.TTestBackfillCursor;
import com.ruoyi.system.domain.TTestIntegrityIssue;
+import com.ruoyi.system.domain.TTestReceptionInterval;
+import com.ruoyi.system.domain.TTestLogicStepMapping;
import com.ruoyi.system.domain.TDetectionChannel;
import com.ruoyi.system.domain.TTestDataRevisionAction;
import com.ruoyi.system.domain.TTestConsoleImportRecord;
@@ -57,7 +57,6 @@
List<TTestCollectorChannel> selectTestCollectorChannels(Long testId);
List<TTestWarningThreshold> selectTestThresholds(Long testId);
/** 按来源和起始边界顺序返回测试接收区间。 */
- List<TTestReceptionInterval> selectTestReceptionIntervals(Long testId);
/** 查询当前正在接收的测试，供接收调度绑定测试事实。 */
List<Long> selectReceivingTestIds();
List<java.util.Map<String, Object>> selectPersistedRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);
@@ -86,23 +85,8 @@
/** 锁定检测柜通道的最新可观测事实，供开始接收校验使用。 */
TDetectionChannel selectReceptionChannelForUpdate(Long channelId);
/** 锁定当前检测柜通道租约；返回空表示可接入。 */
- TTestChannelBinding selectChannelLeaseForUpdate(Long channelId);
- int insertChannelLease(@Param("channelId") Long channelId, @Param("testId") Long testId,
- @Param("bindingId") Long bindingId, @Param("acquiredBy") Long acquiredBy,
- @Param("acquiredAtUtc") Date acquiredAtUtc);
- int insertCollectorChannelLease(@Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
- @Param("testId") Long testId, @Param("bindingId") Long bindingId,
- @Param("acquiredBy") Long acquiredBy, @Param("acquiredAtUtc") Date acquiredAtUtc);
/** 为每个绑定来源追加一个开放接收区间；区间关闭后仅保留历史事实。 */
- int insertReceptionInterval(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
- @Param("sourceType") String sourceType, @Param("sourceId") Long sourceId,
- @Param("sourceChannelCode") String sourceChannelCode, @Param("actionAtUtc") Date actionAtUtc,
- @Param("boundaryNote") String boundaryNote);
/** 在停止动作事务内关闭该测试全部开放区间，返回实际关闭数量。 */
- int closeOpenReceptionIntervals(@Param("testId") Long testId, @Param("endBoundaryAtUtc") Date endBoundaryAtUtc,
- @Param("boundaryNote") String boundaryNote);
- int deleteChannelLeasesByTestId(Long testId);
- int deleteCollectorChannelLeasesByTestId(Long testId);
int hasReceivingTestForAdapter(@Param("adapterCode") String adapterCode);
int hasPausedOrEndedTestForAdapter(@Param("adapterCode") String adapterCode);
List<TDetectionChannel> selectReceivingChannelsForAdapter(@Param("adapterCode") String adapterCode);
@@ -117,33 +101,12 @@
@Param("endedAtUtc") Date endedAtUtc);
/** 查询仍在接收中的采集器来源。 */
- List<TTestCollectorSource> selectReceivingCollectorSources();
/** 查询来源当前开放的断线区间。 */
- TTestCollectorExceptionInterval selectOpenCollectorException(@Param("testId") Long testId,
- @Param("batteryRelationId") Long batteryRelationId, @Param("collectorId") Long collectorId,
- @Param("channelCode") String channelCode);
- int insertCollectorExceptionInterval(TTestCollectorExceptionInterval interval);
- int closeCollectorExceptionInterval(@Param("intervalId") Long intervalId,
- @Param("recoveredAtUtc") Date recoveredAtUtc, @Param("missingToUtc") Date missingToUtc);
- List<TTestCollectorExceptionInterval> selectCollectorExceptionIntervals(Long testId);
+ String selectBtsSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
+ @Param("sequenceId") Long sequenceId);
/** 查询需要自然结束或继续补采的测试。 */
- List<TTest> selectTestsForNaturalEnd();
- List<TTest> selectTestsForBackfill();
/** 按稳定来源身份锁定补采游标，避免应用重启重复推进。 */
- TTestBackfillCursor selectBackfillCursorForUpdate(@Param("testId") Long testId,
- @Param("bindingId") Long bindingId, @Param("sourceType") String sourceType,
- @Param("sourceId") Long sourceId, @Param("sourceChannelCode") String sourceChannelCode);
- int insertBackfillCursor(TTestBackfillCursor cursor);
- int updateBackfillCursor(TTestBackfillCursor cursor);
- int updateTestBackfillStarted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
- int updateTestBackfillWaiting(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc,
- @Param("error") String error);
- int updateTestBackfillCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
- int updateTestCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
- int updateTestNaturallyEnded(@Param("testId") Long testId, @Param("endedAtUtc") Date endedAtUtc);
- String selectSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
- @Param("sequenceId") Long sequenceId);
/** 按测试事实查询通道序号，避免补采重复写入已即时接收的采样。 */
String selectTestSampleContentHash(@Param("testId") Long testId, @Param("channelId") Long channelId,
@Param("sequenceId") Long sequenceId);
@@ -162,8 +125,8 @@
Long selectBtsSampleId(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
@Param("sequenceId") Long sequenceId);
int insertCollectorSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
- @Param("intervalId") Long intervalId,
- @Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
+ @Param("intervalId") Long intervalId, @Param("collectorId") Long collectorId,
+ @Param("channelCode") String channelCode,
@Param("sequenceId") Long sequenceId, @Param("deviceTimeUtc") Date deviceTimeUtc,
@Param("deviceTimeRaw") String deviceTimeRaw, @Param("receivedAtUtc") Date receivedAtUtc,
@Param("metricCode") String metricCode, @Param("metricValue") java.math.BigDecimal metricValue,
@@ -173,6 +136,61 @@
String selectCollectorSampleContentHash(@Param("collectorId") Long collectorId,
@Param("channelCode") String channelCode, @Param("sequenceId") Long sequenceId,
@Param("metricCode") String metricCode);
+ int insertDataRevisionAction(TTestDataRevisionAction action);
+ List<TTestDataRevisionAction> selectDataRevisionActions(TTestDataRevisionAction query);
+ TTestDataRevisionAction selectDataRevisionActionById(Long actionId);
+ int upsertDataOverride(TTestDataOverride override);
+ List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId,
+ @Param("dataType") String dataType);
+ int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
+ int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);
+ int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
+ Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("sequenceId") Long sequenceId);
+ List<Long> selectBtsSampleIdsByDeviceChannelStep(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo);
+ List<Long> selectBtsSampleIdsByDeviceChannelCycle(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("cycleNo") Integer cycleNo);
+ int insertConsoleImportRecord(TTestConsoleImportRecord record);
+ int insertSampleConflict(@Param("testId") Long testId, @Param("channelId") Long channelId,
+ @Param("detail") String detail);
+ int countTestBatteryNo(@Param("testId") Long testId, @Param("batteryNo") String batteryNo);
+ /** 兼容已移除的历史实现源码；当前运行链路不再调用这些方法。 */
+ TTestChannelBinding selectChannelLeaseForUpdate(Long channelId);
+ int insertChannelLease(@Param("channelId") Long channelId, @Param("testId") Long testId,
+ @Param("bindingId") Long bindingId, @Param("acquiredBy") Long acquiredBy,
+ @Param("acquiredAtUtc") Date acquiredAtUtc);
+ int insertCollectorChannelLease(@Param("collectorId") Long collectorId, @Param("channelCode") String channelCode,
+ @Param("testId") Long testId, @Param("bindingId") Long bindingId,
+ @Param("acquiredBy") Long acquiredBy, @Param("acquiredAtUtc") Date acquiredAtUtc);
+ int deleteChannelLeasesByTestId(Long testId);
+ int deleteCollectorChannelLeasesByTestId(Long testId);
+ List<TTestCollectorSource> selectReceivingCollectorSources();
+ TTestCollectorExceptionInterval selectOpenCollectorException(@Param("testId") Long testId,
+ @Param("batteryRelationId") Long batteryRelationId, @Param("collectorId") Long collectorId,
+ @Param("channelCode") String channelCode);
+ int insertCollectorExceptionInterval(TTestCollectorExceptionInterval interval);
+ int closeCollectorExceptionInterval(@Param("intervalId") Long intervalId,
+ @Param("recoveredAtUtc") Date recoveredAtUtc, @Param("missingToUtc") Date missingToUtc);
+ List<TTestCollectorExceptionInterval> selectCollectorExceptionIntervals(Long testId);
+ List<TTest> selectTestsForNaturalEnd();
+ List<TTest> selectTestsForBackfill();
+ TTestBackfillCursor selectBackfillCursorForUpdate(@Param("testId") Long testId,
+ @Param("bindingId") Long bindingId, @Param("sourceType") String sourceType,
+ @Param("sourceId") Long sourceId, @Param("sourceChannelCode") String sourceChannelCode);
+ int insertBackfillCursor(TTestBackfillCursor cursor);
+ int updateBackfillCursor(TTestBackfillCursor cursor);
+ int updateTestBackfillStarted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
+ int updateTestBackfillWaiting(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc,
+ @Param("error") String error);
+ int updateTestBackfillCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
+ int updateTestCompleted(@Param("testId") Long testId, @Param("updatedAtUtc") Date updatedAtUtc);
+ int updateTestNaturallyEnded(@Param("testId") Long testId, @Param("endedAtUtc") Date endedAtUtc);
+ String selectSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
+ @Param("sequenceId") Long sequenceId);
int insertBackfillConflict(@Param("testId") Long testId, @Param("channelId") Long channelId,
@Param("detail") String detail);
List<TTestIntegrityIssue> selectIntegrityIssues(Long testId);
@@ -198,25 +216,9 @@
int resolveIntegrityIssue(@Param("issueId") Long issueId, @Param("resolvedAtUtc") Date resolvedAtUtc);
int countOpenIntegrityIssues(Long testId);
int countOpenExceptions(Long testId);
+ int closeOpenReceptionIntervals(@Param("testId") Long testId, @Param("endBoundaryAtUtc") Date endBoundaryAtUtc,
+ @Param("boundaryNote") String boundaryNote);
+ List<TTestReceptionInterval> selectTestReceptionIntervals(Long testId);
- int insertDataRevisionAction(TTestDataRevisionAction action);
- List<TTestDataRevisionAction> selectDataRevisionActions(TTestDataRevisionAction query);
- TTestDataRevisionAction selectDataRevisionActionById(Long actionId);
- int upsertDataOverride(TTestDataOverride override);
- List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId,
- @Param("dataType") String dataType);
- int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
- int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);
- int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
- Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId,
- @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
- @Param("sequenceId") Long sequenceId);
- List<Long> selectBtsSampleIdsByDeviceChannelStep(@Param("testId") Long testId,
- @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
- @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo);
- List<Long> selectBtsSampleIdsByDeviceChannelCycle(@Param("testId") Long testId,
- @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
- @Param("cycleNo") Integer cycleNo);
- int insertConsoleImportRecord(TTestConsoleImportRecord record);
- int countTestBatteryNo(@Param("testId") Long testId, @Param("batteryNo") String batteryNo);
+ /** ����兼容旧源码的声明；Ticket28 运行链路不再调用。 */
}
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