From 76cd5948e95ddbde9dd4411b466ee75ba20b562e Mon Sep 17 00:00:00 2001
From: yeg <1347747024@qq.com>
Date: 星期四, 03 九月 2026 17:28:29 +0800
Subject: [PATCH] 实现测试预警异常管理
---
ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java | 157 ++++++++++++++++++++++++++++++++++++++++++++++++----
1 files changed, 145 insertions(+), 12 deletions(-)
diff --git a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
index 8a1225a..e5a2f5f 100644
--- a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
+++ b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
@@ -1,41 +1,174 @@
package com.ruoyi.system.mapper;
import java.util.List;
+import java.util.Date;
import org.apache.ibatis.annotations.Param;
import com.ruoyi.system.domain.TTest;
import com.ruoyi.system.domain.TTestBattery;
import com.ruoyi.system.domain.TTestBatteryField;
+import com.ruoyi.system.domain.TTestChannelBinding;
+import com.ruoyi.system.domain.TTestCollectorChannel;
+import com.ruoyi.system.domain.TTestPlanStep;
import com.ruoyi.system.domain.TTestResult;
import com.ruoyi.system.domain.TTestWarningThreshold;
+import com.ruoyi.system.domain.TTestWarningException;
+import com.ruoyi.system.domain.TTestLogicStepMapping;
+import com.ruoyi.system.domain.TDetectionChannel;
+import com.ruoyi.system.domain.TTestDataRevisionAction;
+import com.ruoyi.system.domain.TTestConsoleImportRecord;
+import com.ruoyi.system.domain.TTestDataOverride;
+import com.ruoyi.system.domain.vo.TestBatteryOptionVo;
+import com.ruoyi.system.domain.vo.TestChannelOptionVo;
+import com.ruoyi.system.domain.vo.TestCollectorOptionVo;
+import com.ruoyi.system.domain.vo.TestTypeOptionVo;
+import com.ruoyi.system.domain.vo.TestUserOptionVo;
-/** 测试管理数据访问接口。 */
+/** 测试配置及其只追加审计的数据访问接口。 */
public interface TTestMapper
{
TTest selectTestById(Long testId);
+ TTest selectTestByIdForUpdate(Long testId);
List<TTest> selectTestList(TTest test);
+ List<TTestBattery> selectBatteryNosByTestIds(@Param("testIds") List<Long> testIds);
TTest selectTestByName(String testName);
int insertTest(TTest test);
int updateTest(TTest test);
- int updateTestStatus(@Param("testId") Long testId, @Param("status") String status, @Param("updateBy") String updateBy);
int deleteTestById(@Param("testId") Long testId, @Param("updateBy") String updateBy);
- int deleteTestBatteriesByTestId(@Param("testId") Long testId, @Param("updateBy") String updateBy);
- int deleteTestFieldsByTestId(@Param("testId") Long testId, @Param("updateBy") String updateBy);
- int deleteTestThresholdsByTestId(@Param("testId") Long testId, @Param("updateBy") String updateBy);
+ int deleteTestBindingsByTestId(Long testId);
+ int deleteTestCollectorChannelsByTestId(Long testId);
+ int deleteTestPlanStepsByTestId(Long testId);
+ int deleteTestBatteriesByTestId(Long testId);
+ int deleteTestFieldsByTestId(Long testId);
+ int deleteTestThresholdsByTestId(Long testId);
+ int insertTestPlanStep(TTestPlanStep step);
int insertTestBattery(TTestBattery battery);
int insertTestBatteryField(TTestBatteryField field);
+ int insertTestChannelBinding(TTestChannelBinding binding);
+ int insertTestCollectorChannel(TTestCollectorChannel mapping);
int insertTestThreshold(TTestWarningThreshold threshold);
+ List<TTestPlanStep> selectTestPlanSteps(Long testId);
List<TTestBattery> selectTestBatteries(Long testId);
List<TTestBatteryField> selectTestBatteryFields(Long testId);
+ List<TTestChannelBinding> selectTestChannelBindings(Long testId);
+ List<TTestCollectorChannel> selectTestCollectorChannels(Long testId);
List<TTestWarningThreshold> selectTestThresholds(Long testId);
+ /** 以测试、指标和阈值规则为开放异常键原子聚合成功接收的超限值。 */
+ int upsertWarningException(@Param("testId") Long testId, @Param("thresholdId") Long thresholdId,
+ @Param("sourceType") String sourceType, @Param("sourceIdentity") String sourceIdentity,
+ @Param("metricCode") String metricCode, @Param("value") java.math.BigDecimal value,
+ @Param("unit") String unit, @Param("ruleSnapshot") String ruleSnapshot,
+ @Param("severity") String severity, @Param("occurredAt") Date occurredAt);
+ /** 查询异常事实；不从设备状态或缺失数据推导异常。 */
+ List<TTestWarningException> selectWarningExceptions(@Param("testId") Long testId,
+ @Param("status") String status);
+ TTestWarningException selectWarningExceptionById(Long exceptionId);
+ /** 仅将开放异常转为已关闭，原始异常事实仍保留。 */
+ int closeWarningException(@Param("exceptionId") Long exceptionId, @Param("handledBy") Long handledBy,
+ @Param("handledByName") String handledByName, @Param("handledAt") Date handledAt,
+ @Param("handlingNote") String handlingNote);
+ /** 查询当前正在接收的测试，供接收调度绑定测试事实。 */
+ List<Long> selectReceivingTestIds();
+ int insertRealtimeSnapshot(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
+ @Param("channelId") Long channelId, @Param("collectorId") Long collectorId,
+ @Param("captureSlotUtc") Date captureSlotUtc, @Param("cabinetSequenceId") Long cabinetSequenceId,
+ @Param("cabinetDeviceTimeUtc") Date cabinetDeviceTimeUtc, @Param("cabinetDeviceTimeRaw") String cabinetDeviceTimeRaw,
+ @Param("collectorSequenceId") Long collectorSequenceId, @Param("collectorDeviceTimeUtc") Date collectorDeviceTimeUtc,
+ @Param("collectorDeviceTimeRaw") String collectorDeviceTimeRaw, @Param("serverReceivedAtUtc") Date serverReceivedAtUtc,
+ @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo, @Param("stepType") String stepType,
+ @Param("stepName") String stepName, @Param("voltageV") java.math.BigDecimal voltageV,
+ @Param("currentA") java.math.BigDecimal currentA, @Param("capacityAh") java.math.BigDecimal capacityAh,
+ @Param("energyWh") java.math.BigDecimal energyWh, @Param("temperature") java.math.BigDecimal temperature,
+ @Param("positivePotential") java.math.BigDecimal positivePotential,
+ @Param("negativePotential") java.math.BigDecimal negativePotential,
+ @Param("extensionMeasurementsJson") String extensionMeasurementsJson, @Param("contentSha256") byte[] contentSha256);
+ List<java.util.Map<String, Object>> selectPersistedRealtimeSnapshots(@Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedCollectorRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedSteps(@org.apache.ibatis.annotations.Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedCycles(@org.apache.ibatis.annotations.Param("testId") Long testId);
List<TTestResult> selectTestResults(TTestResult result);
- int countTestingByBatteryNo(@Param("batteryNo") String batteryNo, @Param("testId") Long testId);
- int countTestingByCabinetChannel(@Param("cabinetId") Long cabinetId, @Param("channelNo") Integer channelNo, @Param("testId") Long testId);
- int countTestBatteryRelation(@Param("testId") Long testId, @Param("relationId") Long relationId);
- int countTestBatteryFields(@Param("testId") Long testId, @Param("relationId") Long relationId, @Param("fieldName") String fieldName);
- int countTestThreshold(@Param("testId") Long testId, @Param("thresholdType") String thresholdType, @Param("thresholdId") Long thresholdId);
+ String selectLogicStepMappingsJson(Long testId);
+ int updateLogicStepMappings(@Param("testId") Long testId, @Param("mappingsJson") String mappingsJson,
+ @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);
+ int updateConsoleDetail(@Param("testId") Long testId, @Param("detailJson") String detailJson,
+ @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);
int countTestTypeEnabled(Long testTypeId);
int countUserEnabled(Long userId);
int countBatteryInEnabledGroup(@Param("groupId") Long groupId, @Param("batteryNo") String batteryNo);
- int countCabinetEnabled(Long cabinetId);
- int countCollectorEnabled(@Param("collectorId") Long collectorId, @Param("cabinetId") Long cabinetId);
+ int countRegisteredChannel(Long channelId);
+ int countCollectorEnabled(Long collectorId);
+ Integer selectCollectorChannelCount(Long collectorId);
+ String selectCollectorCode(Long collectorId);
+ List<TestUserOptionVo> selectEnabledUserOptions();
+ List<TestTypeOptionVo> selectEnabledTestTypeOptions();
+ List<TestBatteryOptionVo> selectEnabledBatteryOptions();
+ List<TestChannelOptionVo> selectRegisteredChannelOptions();
+ List<TestCollectorOptionVo> selectEnabledCollectorOptions();
+ int insertTestAudit(@Param("testId") Long testId, @Param("eventType") String eventType,
+ @Param("actorId") Long actorId, @Param("actorName") String actorName,
+ @Param("previousValue") String previousValue, @Param("newValue") String newValue);
+
+ /** 锁定检测柜通道的最新可观测事实，供开始接收校验使用。 */
+ TDetectionChannel selectReceptionChannelForUpdate(Long channelId);
+ int hasReceivingTestForAdapter(@Param("adapterCode") String adapterCode);
+ List<TDetectionChannel> selectReceivingChannelsForAdapter(@Param("adapterCode") String adapterCode);
+ int updateReceptionStarted(@Param("testId") Long testId, @Param("startedAtUtc") Date startedAtUtc,
+ @Param("runtimeAttach") boolean runtimeAttach, @Param("updateBy") String updateBy);
+ int updateReceptionPaused(@Param("testId") Long testId, @Param("updateBy") String updateBy,
+ @Param("updatedAtUtc") Date updatedAtUtc);
+ int updateReceptionResumed(@Param("testId") Long testId, @Param("updateBy") String updateBy,
+ @Param("updatedAtUtc") Date updatedAtUtc);
+ int updateReceptionStopped(@Param("testId") Long testId, @Param("updateBy") String updateBy,
+ @Param("endedAtUtc") Date endedAtUtc);
+
+ String selectBtsSampleContentHash(@Param("channelId") Long channelId, @Param("btsTestId") String btsTestId,
+ @Param("sequenceId") Long sequenceId);
+
+ int insertBtsSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
+ @Param("channelId") Long channelId,
+ @Param("btsTestId") String btsTestId, @Param("sequenceId") Long sequenceId,
+ @Param("deviceTimeUtc") Date deviceTimeUtc, @Param("deviceTimeRaw") String deviceTimeRaw,
+ @Param("receivedAtUtc") Date receivedAtUtc, @Param("cycleNo") Integer cycleNo,
+ @Param("stepNo") Integer stepNo, @Param("stepType") String stepType, @Param("stepName") String stepName,
+ @Param("testTimeMs") Long testTimeMs, @Param("voltageV") java.math.BigDecimal voltageV,
+ @Param("currentA") java.math.BigDecimal currentA, @Param("capacityAh") java.math.BigDecimal capacityAh,
+ @Param("energyWh") java.math.BigDecimal energyWh, @Param("contentSha256") byte[] contentSha256);
+ int insertBtsMeasurement(@Param("sampleId") Long sampleId, @Param("metricCode") String metricCode,
+ @Param("metricValue") java.math.BigDecimal metricValue, @Param("unit") String unit,
+ @Param("sourceType") String sourceType);
+ int insertCollectorSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
+ @Param("collectorId") Long collectorId,
+ @Param("adapterCode") String adapterCode,
+ @Param("channelCode") String channelCode,
+ @Param("sequenceId") Long sequenceId, @Param("deviceTimeUtc") Date deviceTimeUtc,
+ @Param("deviceTimeRaw") String deviceTimeRaw, @Param("receivedAtUtc") Date receivedAtUtc,
+ @Param("metricCode") String metricCode, @Param("metricValue") java.math.BigDecimal metricValue,
+ @Param("unit") String unit, @Param("contentSha256") byte[] contentSha256);
+ String selectCollectorSampleContentHash(@Param("collectorId") Long collectorId,
+ @Param("channelCode") String channelCode, @Param("sequenceId") Long sequenceId,
+ @Param("metricCode") String metricCode);
+ int insertDataRevisionAction(TTestDataRevisionAction action);
+ List<TTestDataRevisionAction> selectDataRevisionActions(TTestDataRevisionAction query);
+ TTestDataRevisionAction selectDataRevisionActionById(Long actionId);
+ int upsertDataOverride(TTestDataOverride override);
+ List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId,
+ @Param("dataType") String dataType);
+ List<java.util.Map<String, Object>> selectConsoleImportRecords(@Param("testId") Long testId,
+ @Param("dataType") String dataType);
+ int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
+ int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);
+ int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
+ Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("sequenceId") Long sequenceId);
+ List<Long> selectBtsSampleIdsByDeviceChannelStep(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo);
+ List<Long> selectBtsSampleIdsByDeviceChannelCycle(@Param("testId") Long testId,
+ @Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
+ @Param("cycleNo") Integer cycleNo);
+ int insertConsoleImportRecord(TTestConsoleImportRecord record);
+ int insertSampleConflict(@Param("testId") Long testId, @Param("channelId") Long channelId,
+ @Param("detail") String detail);
+ int countTestBatteryNo(@Param("testId") Long testId, @Param("batteryNo") String batteryNo);
}
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