From dd1af98f7e679290e5280e2aff58d7ff5237c5fb Mon Sep 17 00:00:00 2001
From: yeg <1347747024@qq.com>
Date: 星期六, 05 九月 2026 11:17:11 +0800
Subject: [PATCH] 实现测试数据物理删除修订
---
ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java | 69 ++++++++++++++++++++++++++++++++++
1 files changed, 68 insertions(+), 1 deletions(-)
diff --git a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
index c1b9ff2..930905e 100644
--- a/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
+++ b/ruoyi-system/src/main/java/com/ruoyi/system/mapper/TTestMapper.java
@@ -11,11 +11,15 @@
import com.ruoyi.system.domain.TTestPlanStep;
import com.ruoyi.system.domain.TTestResult;
import com.ruoyi.system.domain.TTestWarningThreshold;
+import com.ruoyi.system.domain.TTestWarningException;
import com.ruoyi.system.domain.TTestLogicStepMapping;
import com.ruoyi.system.domain.TDetectionChannel;
import com.ruoyi.system.domain.TTestDataRevisionAction;
import com.ruoyi.system.domain.TTestConsoleImportRecord;
import com.ruoyi.system.domain.TTestDataOverride;
+import com.ruoyi.system.domain.TTestRealtimeRecord;
+import com.ruoyi.system.domain.TTestStepRecord;
+import com.ruoyi.system.domain.TTestCycleRecord;
import com.ruoyi.system.domain.vo.TestBatteryOptionVo;
import com.ruoyi.system.domain.vo.TestChannelOptionVo;
import com.ruoyi.system.domain.vo.TestCollectorOptionVo;
@@ -33,6 +37,7 @@
int insertTest(TTest test);
int updateTest(TTest test);
int deleteTestById(@Param("testId") Long testId, @Param("updateBy") String updateBy);
+ int deleteTestThresholdRowsByTestId(Long testId);
int deleteTestBindingsByTestId(Long testId);
int deleteTestCollectorChannelsByTestId(Long testId);
int deleteTestPlanStepsByTestId(Long testId);
@@ -48,17 +53,62 @@
List<TTestPlanStep> selectTestPlanSteps(Long testId);
List<TTestBattery> selectTestBatteries(Long testId);
List<TTestBatteryField> selectTestBatteryFields(Long testId);
+ /** 读取测试所选电池组的当前字段值，不创建测试快照。 */
+ List<TTestBatteryField> selectCurrentBatteryFields(Long testId);
List<TTestChannelBinding> selectTestChannelBindings(Long testId);
List<TTestCollectorChannel> selectTestCollectorChannels(Long testId);
List<TTestWarningThreshold> selectTestThresholds(Long testId);
+ /** 以测试、指标和阈值规则为开放异常键原子聚合成功接收的超限值。 */
+ int upsertWarningException(@Param("testId") Long testId, @Param("thresholdId") Long thresholdId,
+ @Param("sourceType") String sourceType, @Param("sourceIdentity") String sourceIdentity,
+ @Param("metricCode") String metricCode, @Param("value") java.math.BigDecimal value,
+ @Param("unit") String unit, @Param("ruleSnapshot") String ruleSnapshot,
+ @Param("severity") String severity, @Param("occurredAt") Date occurredAt);
+ /** 查询异常事实；不从设备状态或缺失数据推导异常。 */
+ List<TTestWarningException> selectWarningExceptions(@Param("testId") Long testId,
+ @Param("status") String status);
+ TTestWarningException selectWarningExceptionById(Long exceptionId);
+ /** 仅将开放异常转为已关闭，原始异常事实仍保留。 */
+ int closeWarningException(@Param("exceptionId") Long exceptionId, @Param("handledBy") Long handledBy,
+ @Param("handledByName") String handledByName, @Param("handledAt") Date handledAt,
+ @Param("handlingNote") String handlingNote);
/** 查询当前正在接收的测试，供接收调度绑定测试事实。 */
List<Long> selectReceivingTestIds();
+ int insertRealtimeSnapshot(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
+ @Param("channelId") Long channelId, @Param("collectorId") Long collectorId,
+ @Param("captureSlotUtc") Date captureSlotUtc, @Param("cabinetSequenceId") Long cabinetSequenceId,
+ @Param("cabinetDeviceTimeUtc") Date cabinetDeviceTimeUtc, @Param("cabinetDeviceTimeRaw") String cabinetDeviceTimeRaw,
+ @Param("collectorSequenceId") Long collectorSequenceId, @Param("collectorDeviceTimeUtc") Date collectorDeviceTimeUtc,
+ @Param("collectorDeviceTimeRaw") String collectorDeviceTimeRaw, @Param("serverReceivedAtUtc") Date serverReceivedAtUtc,
+ @Param("cycleNo") Integer cycleNo, @Param("stepNo") Integer stepNo, @Param("stepType") String stepType,
+ @Param("stepName") String stepName, @Param("voltageV") java.math.BigDecimal voltageV,
+ @Param("currentA") java.math.BigDecimal currentA, @Param("capacityAh") java.math.BigDecimal capacityAh,
+ @Param("energyWh") java.math.BigDecimal energyWh, @Param("temperature") java.math.BigDecimal temperature,
+ @Param("positivePotential") java.math.BigDecimal positivePotential,
+ @Param("negativePotential") java.math.BigDecimal negativePotential,
+ @Param("extensionMeasurementsJson") String extensionMeasurementsJson, @Param("contentSha256") byte[] contentSha256);
+ int insertRealtimeRecord(TTestRealtimeRecord record);
+ String selectRealtimeRecordContentHash(@Param("testId") Long testId, @Param("testBatteryId") Long testBatteryId,
+ @Param("captureSlotUtc") Date captureSlotUtc);
+ int insertStepRecord(TTestStepRecord record);
+ int insertCycleRecord(TTestCycleRecord record);
+ String selectStepRecordContentHash(@Param("testBatteryId") Long testBatteryId,
+ @Param("sourceIdentity") String sourceIdentity, @Param("dedupeKey") String dedupeKey);
+ String selectCycleRecordContentHash(@Param("testBatteryId") Long testBatteryId,
+ @Param("sourceIdentity") String sourceIdentity, @Param("dedupeKey") String dedupeKey);
+ List<java.util.Map<String, Object>> selectPersistedFinalRealtimeRecords(@Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedFinalStepRecords(@Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedFinalCycleRecords(@Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedRealtimeSnapshots(@Param("testId") Long testId);
List<java.util.Map<String, Object>> selectPersistedRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);
+ List<java.util.Map<String, Object>> selectPersistedCollectorRecords(@org.apache.ibatis.annotations.Param("testId") Long testId);
List<java.util.Map<String, Object>> selectPersistedSteps(@org.apache.ibatis.annotations.Param("testId") Long testId);
List<java.util.Map<String, Object>> selectPersistedCycles(@org.apache.ibatis.annotations.Param("testId") Long testId);
List<TTestResult> selectTestResults(TTestResult result);
String selectLogicStepMappingsJson(Long testId);
int updateLogicStepMappings(@Param("testId") Long testId, @Param("mappingsJson") String mappingsJson,
+ @Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);
+ int updateConsoleDetail(@Param("testId") Long testId, @Param("detailJson") String detailJson,
@Param("updateBy") String updateBy, @Param("updateTime") Date updateTime);
int countTestTypeEnabled(Long testTypeId);
int countUserEnabled(Long userId);
@@ -80,7 +130,6 @@
TDetectionChannel selectReceptionChannelForUpdate(Long channelId);
int hasReceivingTestForAdapter(@Param("adapterCode") String adapterCode);
List<TDetectionChannel> selectReceivingChannelsForAdapter(@Param("adapterCode") String adapterCode);
- boolean collectorOnline(Long collectorId);
int updateReceptionStarted(@Param("testId") Long testId, @Param("startedAtUtc") Date startedAtUtc,
@Param("runtimeAttach") boolean runtimeAttach, @Param("updateBy") String updateBy);
int updateReceptionPaused(@Param("testId") Long testId, @Param("updateBy") String updateBy,
@@ -107,20 +156,38 @@
@Param("sourceType") String sourceType);
int insertCollectorSample(@Param("testId") Long testId, @Param("bindingId") Long bindingId,
@Param("collectorId") Long collectorId,
+ @Param("adapterCode") String adapterCode,
@Param("channelCode") String channelCode,
@Param("sequenceId") Long sequenceId, @Param("deviceTimeUtc") Date deviceTimeUtc,
@Param("deviceTimeRaw") String deviceTimeRaw, @Param("receivedAtUtc") Date receivedAtUtc,
@Param("metricCode") String metricCode, @Param("metricValue") java.math.BigDecimal metricValue,
@Param("unit") String unit, @Param("contentSha256") byte[] contentSha256);
+ String selectCollectorSampleContentHash(@Param("collectorId") Long collectorId,
+ @Param("channelCode") String channelCode, @Param("sequenceId") Long sequenceId,
+ @Param("metricCode") String metricCode);
int insertDataRevisionAction(TTestDataRevisionAction action);
List<TTestDataRevisionAction> selectDataRevisionActions(TTestDataRevisionAction query);
TTestDataRevisionAction selectDataRevisionActionById(Long actionId);
int upsertDataOverride(TTestDataOverride override);
List<TTestDataOverride> selectDataOverrides(@Param("testId") Long testId,
@Param("dataType") String dataType);
+ List<java.util.Map<String, Object>> selectConsoleImportRecords(@Param("testId") Long testId,
+ @Param("dataType") String dataType);
int deleteBtsSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
int deleteBtsMeasurementsBySampleIds(@Param("sampleIds") List<Long> sampleIds);
int deleteCollectorSamplesByIds(@Param("testId") Long testId, @Param("sampleIds") List<Long> sampleIds);
+ int deleteRealtimeRecordsByIds(@Param("testId") Long testId, @Param("recordIds") List<Long> recordIds);
+ int deleteRealtimeSnapshotsByIds(@Param("testId") Long testId, @Param("snapshotIds") List<Long> snapshotIds);
+ int deleteStepRecordsByIds(@Param("testId") Long testId, @Param("recordIds") List<Long> recordIds);
+ int deleteCycleRecordsByIds(@Param("testId") Long testId, @Param("recordIds") List<Long> recordIds);
+ int deleteCollectorSamplesByIdentities(@Param("testId") Long testId, @Param("identities") List<String> identities);
+ int deleteTestRealtimeRecordsByTestId(Long testId);
+ int deleteTestRealtimeSnapshotsByTestId(Long testId);
+ int deleteTestStepRecordsByTestId(Long testId);
+ int deleteTestCycleRecordsByTestId(Long testId);
+ int deleteTestDataRevisionActionsByTestId(Long testId);
+ int deleteTestDataOverridesByTestId(Long testId);
+ int deleteTestConsoleImportRecordsByTestId(Long testId);
Long selectBtsSampleIdByDeviceChannelSequence(@Param("testId") Long testId,
@Param("deviceId") Long deviceId, @Param("channelNo") Long channelNo,
@Param("sequenceId") Long sequenceId);
--
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